Tag: Modify

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Keysight Technologies and ROHM Semiconductor Enable Designers to Rapidly Modify SMPS Reference Design for SiC Power Devices

“Digital Twin” of ROHM Reference Design Enables “What if…” Design Space Exploration

Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect and secure the world, and ROHM Semiconductor, a leading semiconductor company, jointly announce today a PathWave Advanced Design System (ADS)-compatible workspace that enables designers to perform pre-compliance testing on virtual prototypes of switched-mode power supply (SMPS) designs. This new capability saves time and cost by catching errors early in the design before they become a big problem.

Demand for SMPS is driven by the need for greater efficiency, increased power density and lower cost. Fast, low-loss switches made from silicon carbide (SiC) and related materials will power future applications due to the high performance and efficiency they enable. However, unwanted side effects from high-speed switching include voltage spikes (“ringing”). In addition, it is more difficult to meet conducted and radiated electromagnetic interference (EMI) specifications in higher speed designs. Pre-compliance analysis of a “virtual prototype” or “digital twin” is ideal for managing this challenge, but previously required expertise to build and use the necessary design information, called a “workspace.”

To address this, Keysight teamed with ROHM to create the “twin” of ROHM’s reference design (model P01SCT2080KE-EVK-001) available to mutual customers via Keysight’s web site at https://www.keysight.com/us/en/assets/3120-1476/application-notes/Virtual-Reference-Design.pdf.

Virtual prototypes are complementary to physical prototypes. Physical prototypes are the gold standard for compliance and measured characteristics, but have several drawbacks including: expensive and time consuming to design, build and measure; are vulnerable to catastrophic failure (the infamous “smoke test” that produces actual smoke); and it is hard to get a measurement probe onto interior nodes.

In contrast, virtual prototypes are easy to change and while they do flag device overstress as warning messages during simulation, they never emit real